picolibrary-microchip-megaavr0

::picolibrary::Microchip::megaAVR0::I2C::Controller scan interactive test

Table of Contents

1. Test Configuration Options
2. Test Executable Name

Test Configuration Options

The ::picolibrary::Microchip::megaAVR0::I2C::Controller scan interactive test supports the following configuration options:

• PICOLIBRARY_MICROCHIP_MEGAAVR0_I2C_CONTROLLER_ENABLE_SCAN_INTERACTIVE_TEST (defaults to OFF): enable the ::picolibrary::Microchip::megaAVR0::I2C::Controller scan interactive test
  • The following configuration options are available if PICOLIBRARY_MICROCHIP_MEGAAVR0_I2C_CONTROLLER_ENABLE_SCAN_INTERACTIVE_TEST is ON:
    • PICOLIBRARY_MICROCHIP_MEGAAVR0_I2C_CONTROLLER_SCAN_INTERACTIVE_TEST_CONTROLLER_TWI: ::picolibrary::Microchip::megaAVR0::I2C::Controller scan interactive test controller TWI
    • PICOLIBRARY_MICROCHIP_MEGAAVR0_I2C_CONTROLLER_SCAN_INTERACTIVE_TEST_CONTROLLER_TWI_SDA_HOLD_TIME: ::picolibrary::Microchip::megaAVR0::I2C::Controller scan interactive test controller TWI SDA hold time
    • PICOLIBRARY_MICROCHIP_MEGAAVR0_I2C_CONTROLLER_SCAN_INTERACTIVE_TEST_CONTROLLER_TWI_BUS_SPEED: ::picolibrary::Microchip::megaAVR0::I2C::Controller scan interactive test controller TWI bus speed
    • PICOLIBRARY_MICROCHIP_MEGAAVR0_I2C_CONTROLLER_SCAN_INTERACTIVE_TEST_CONTROLLER_TWI_CLOCK_GENERATOR_SCALING_FACTOR: ::picolibrary::Microchip::megaAVR0::I2C::Controller scan interactive test controller TWI clock generator scaling factor
    • PICOLIBRARY_MICROCHIP_MEGAAVR0_I2C_CONTROLLER_SCAN_INTERACTIVE_TEST_CONTROLLER_TWI_INACTIVE_BUS_TIME_OUT: ::picolibrary::Microchip::megaAVR0::I2C::Controller scan interactive test controller TWI inactive bus time-out
    • PICOLIBRARY_MICROCHIP_MEGAAVR0_I2C_CONTROLLER_SCAN_INTERACTIVE_TEST_CONTROLLER_TWI_ROUTE: ::picolibrary::Microchip::megaAVR0::I2C::Controller scan interactive test controller TWI route

Test Executable Name

test-interactive-picolibrary-microchip-megaavr0-i2c-controller-scan

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